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This preprint analyzes papers reporting Hall mobility measurements in the three groups of materials (metal-oxide or metal-halide perovskites, conjugated polymers, and crystalline small-molecule organic semiconductors) published in the period 2003 - 2023. The reported room-temperature Hall mobility and the calculated Hall reliability score for each paper are listed in a Table. The Hall reliability score was determined according to the checklist of Hall effect measurements proposed in V. Bruevich and V. Podzorov, “Reporting Hall effect measurements of the charge carrier mobility in emergent materials”, in preparation for Nat. Electron. (2023). This parameter (an integer between 0 and 16) is designed as a metric for evaluating the completeness, reliability, and potential reproducibility of Hall mobility measurements reported in papers. The algorithm for its calculation is given in this preprint.
Hall effect, mobility, Hall mobility, semiconductor, transistor, conductivity
Hall effect, mobility, Hall mobility, semiconductor, transistor, conductivity
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