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EMPIR 19ENG06 HEFMAG Technical report on new scanning probe technique for imaging dynamic domain processes

descriptionPublicationkeyboard_double_arrow_right Report 25 Aug 2023Publisher:Zenodo
Authors: Neu, Volker; Singh, Balram; Deldar, Shayan; Schäfer, Rudolf;

doi: 10.5281/zenodo.8283104 , 10.5281/zenodo.8283103

EMPIR 19ENG06 HEFMAG Technical report on new scanning probe technique for imaging dynamic domain processes

Abstract

Technical report on a new MFM-based scanning probe technique for imaging dynamic domain processes applied to grain-oriented Fe-3%Si sheets

Keywords

grain-oriented electrical steel, magnetic domains, magnetic force microscopy, dynamic domain porcesses, EMPIR 19ENG06 HEFMAG

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
views
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