The Transient Current Technique (TCT) as a tool for studying signal formation in solid-state detectors is limited in resolution and allows for two-dimensional scans only. Two-Photon Absorption (TPA) TCT overcomes this limitation by employing a femtosecond laser pulse that creates charges only in a tiny voxel in the focal point of the laser beam, allowing, for example, the characterization of small volume pixel detectors. The proof of concept for the TPA-TCT technique on silicon sensors was previously obtained in a complex laser facility and found to be very valuable for a large range of applications. This triggered the development, design and construction of a custom made bench-test system for TPA-TCT measurements. In this report we provide a summary on the final commissioning of this newly developed table top TPA-TCT system at CERN, Geneva, Switzerland and CSIC-IFCA, Santander, Spain.