Deliverable 2.5 exposes advances related to WP2 – T2.1.3. Organic photodetector (OPD) development (demo 2), T2.1.4 Thin film transistors development and T2.4 Quality control of the printed materials and devices. Task T2.1.3 and T2.4 cover the characterisation and quality control of the printed layers comprising the OPD device and the device itself, including the inspection of film thickness and roughness by profilometry, the compatibility between layers, optical properties by UV-VIS/IR spectroscopy and electrical characterisation. Task T2.1.4 is related to the development of thin-film transistors (TFT) test structures by TNO, consisting of an array of TFTs fabricated on polyimide (PI) films on a glass carrier. A detailed description of the selected TFT to be applied in demo 2 is reported.