Accurate and robust characterization of volume scattering materials using the intensity-based inverse adding-doubling method

descriptionPublicationkeyboard_double_arrow_right Article , Conference object , Other literature type 21 Jun 2019 Belgium Publisher:SPIEJournal:Modeling Aspects in Optical Metrology VII

Authors: Correia, António; Hanselaer, Peter; Meuret, Youri;

doi: 10.1117/12.2525791 , 10.5281/zenodo.7780602 , 10.5281/zenodo.7780601

Accurate and robust characterization of volume scattering materials using the intensity-based inverse adding-doubling method

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Abstract

Abstract of a SPIE conference paper. For the full paper see DOI: 10.1117/12.2525791 (SPIE) or https://lirias.kuleuven.be/2825988?limo=0 (open access).

Country

Belgium

Related Organizations

Katholieke Universiteit Leuven
Belgium
KU Leuven
Belgium

Keywords

5102 Atomic, molecular and optical physics, Technology, Science & Technology, Optics, solid-state lighting, PARAMETERS, Volume scattering, adding-doubling, 4006 Communications engineering, 4009 Electronics, sensors and digital hardware, Physical Sciences, inverse problem, Instruments & Instrumentation

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