Abstract The mineralogical analyses of soil around NMDC Dantewada, India are depicted in this report. Various physical and chemical analyses were performed on this soil sample. The properties of soil clay minerals were studied using a traditional X-ray diffraction spectrum. It is possible to extract information from the reflected wave that can be used to measure dielectric characteristics. The chemical composition and physical qualities of a material determine its dielectric properties. Soil samples were collected from NMDC Dantewada district agricultural zone. The dielectric constant of soil increases slowly as the moisture content of the soil increases. The X-ray diffraction spectrum revealed the presence of clay minerals in the soils, but the other spectrum revealed no indication of their presence. X-ray diffraction has a superior resolution, compactness, and scanning range than the traditional approach. As a result, it appeared to be a better fit for agricultural soil spectroscopic research.