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ANNEALING EFFECT ON CHARACTERISTICS OF NICKEL-TUNGSTEN ALLOY THIN FILMS

Authors: Dr. T. Baskar; Dr. A. Shaji George;

ANNEALING EFFECT ON CHARACTERISTICS OF NICKEL-TUNGSTEN ALLOY THIN FILMS

Abstract

Electroplating at room temperature was used to create NiW alloy thin films. After that, the electroplated NiW thin films were annealed at 200 degrees Celsius. The texture of NiW deposited films is oriented in the FCC phase. Morphological, structural, and mechanical characterizations were performed on them. On the surface, NiW films were brilliant and uniformly covered. NiW film deposition was also nanoscale, with an average crystalline size of roughly 92 nm. After annealing, the microhardness of NiW was 138 VHN.

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Keywords

Electroplating, electrolytic bath, crystalline size, VSM, Ni-P, X-ray diffraction, VHN, SEM.

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This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
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influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
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