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{"references": ["Shan, C., Chen, B., Hu, C., Xue, J., & Li, N. (2014). Software defect prediction model based on LLE and SVM.", "Lee, T., Nam, J., Han, D., Kim, S., & In, H. P. (2016). Developer micro interaction metrics for software defect prediction. IEEE Transactions on Software Engineering, 42(11), 1015- 1035.", "Huda, S., Alyahya, S., Ali, M. M., Ahmad, S., Abawajy, J., Al-Dossari, H., & Yearwood, J. (2017). A framework for software defect prediction and metric selection. IEEE access, 6, 2844-2858..", "Yu, Q., Qian, J., Jiang, S., Wu, Z., & Zhang, G. (2019). An empirical study on the effectiveness of feature selection for cross-project defect prediction. IEEE Access, 7, 35710- 35718.", "Felix, E. A., & Lee, S. P. (2017). Integrated approach to software defect prediction. IEEE Access, 5, 21524- 21547.", "Liang, H., Yu, Y., Jiang, L., & Xie, Z. (2019). Seml: A semantic LSTM model for software defect prediction. IEEE Access, 7, 83812- 83824.", "He, H., Zhang, X., Wang, Q., Ren, J., Liu, J., Zhao, X., & Cheng, Y. (2019). Ensemble multiboost based on ripper classifier for prediction of imbalanced software defect data. IEEE Access, 7, 110333-110343.", "Cai, Z., Lu, L., & Qiu, S. (2019). An abstract syntax tree encoding method for cross-project defect prediction. IEEE Access, 7, 170844- 170853.", "Huda, S., Liu, K., Abdelrazek, M., Ibrahim, A., Alyahya, S., Al-Dossari, H., & Ahmad, S. (2018). An ensemble oversampling model for class imbalance problem in software defect prediction. IEEE access, 6, 24184- 24195.", "Chen, D., Chen, X., Li, H., Xie, J., & Mu, Y. (2019). Deepcpdp: Deep learning based cross-project defect prediction. IEEE Access, 7, 184832- 184848."]}
For the purpose of creating software defect metrics, data from software repositories such as code complexity and change records is used to build machine learning classifiers that can detect problematic code snippets. For IT SME's, this study piece aims to provide light on the correlations between numerous variables. The data is analysed and interpreted with the aid of IBM SPSS and a well-structured questionnaire.
software defect metrics, software repositories etc.
software defect metrics, software repositories etc.
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