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Eigenvector Metal Etch Data Parser - Python

Authors: Gopinadhan, Jaganadh;

Eigenvector Metal Etch Data Parser - Python

Abstract

The Eigenvector Etch Data Parser is developed to read Matlab data files published by Eigenvector[1]. The data is from a LAM 9600 Metal Etching Machine and was collected in 1995's. The data is available as three individual .mat files MACHINE_Data.mat, OES_DATA.mat, and RFM_DATA.mat. The parser reads each file and converts the calibration data (sensor data) and test data (sensor data) into a single DataFrame. The parser introduced an additional field in the data 'fault_name', which helps the user identify the normal/calibration wafers and test wafers(with defects). We tested the parser in Python3 environments only; if you are looking for Python2 compatibility, please test and create a bug/pull request as applicable. The source code is released under Apache 2.0 license and is available at https://github.com/jaganadhg/egvsemicon. A detailed note on the data and usage of the parser is available at https://github.com/jaganadhg/egvsemicon/blob/main/EGV_Data_exploreer.ipynb. [1] https://eigenvector.com/resources/data-sets/ [2] https://github.com/jaganadhg/egvsemicon/blob/main/EGV_Data_exploreer.ipynb

Keywords

Microfabrication, Semiconductor, Micro-fabrication, Data Science, Data Mining, Micro Nano Fabrication, Wafer Etching

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citations
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
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