Dimensional Metrology has been evolving ever since the measurement standards were established. The need to minimize errors and improve upon accuracy and precision has prompted Metrologists across the globe to innovate measurement techniques. Any object produced should comply with its designated dimensions to meet the functional requirements. The innovative methods adopted for checking dimensional compliance of objects is discussed in this paper. This paper gives a brief overview of improvements in Coordinate Measuring Machines, use of Scanning Electron Microscope and Computed Tomography towards dimensional metrology, advancements and challenges in Micro and Nano dimensional metrology.

Published Paper ID: JETIR1705028 Registration ID: 170320 Published In: Volume 4 | Issue 5 | Year May-2017 DOI (Digital Object Identifier): ISSN Number: 2349-5162