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Time- and angle-resolved photoemission spectroscopy data of bismuthene on a SiC substrate at room temperature using a laser-based XUV source and a hemispherical analyzer and time-of-flight momentum microscope for photoelectron detection. The experiments were performed at the Fritz-Haber-Institute of the Max-Planck Society, Berlin, Germany. The bismuthene samples were prepared and characterized at the University of Würzburg, Germany. The photoemission data and associated metadata are stored in the NeXus data format (see https://mpes.science/ and https://www.nexusformat.org/), which is based on the HDF5 file format. The scanning tunneling microscopy data are stored in the native Gwyddion data format (http://gwyddion.net/). A description of the content of each file can be found in the spreadsheet summary_files.xlsx.
Topological Insulator, Ultrafast, Bismuthene, ARPES, Photoemission, Spectroscopy
Topological Insulator, Ultrafast, Bismuthene, ARPES, Photoemission, Spectroscopy
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