TAdeJong/LEEM-analysis

integration_instructionsResearch softwarekeyboard_double_arrow_right Software 19 Aug 2021Publisher:ZenodoFunded by:DFG | unidentified, NWO | How Far can Electrons Fly...

Authors: De Jong, Tobias A.;

Code repository: https://github.com/TAdeJong/LEEM-analysis/tree/v0.2.1

doi: 10.5281/zenodo.5223927 , 10.5281/zenodo.3539538

TAdeJong/LEEM-analysis

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Abstract

This release includes some general cleanup and restructuring of code, and the addition of the stitching code to stitch LEEM images together in a consistent/scientific way. This code was used in different forms to analyse the data for the paper de Jong et al., Imaging moiré deformation and dynamics in twisted bilayer graphene, arxiv:2107.14716

If you find this software useful and use it in scientific work, please cite it as below.

Keywords

image registration, parallel programming, data visualization, electron spectroscopy, Low Energy Electron Microscopy, physics, surface science

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