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Archived LA-ICP-MS and EBSD data files for the Bernard et al. manuscript entitled, "Melt-assisted deformation in the lower crust of an active plate boundary, Baja California" (LITHOS, accepted 2022). EBSD data were acquired on an Oxford Instruments Symmetry EBSD detector on a FEI Apreo LoVac field emission gun scanning electron microscope at the University of California San Diego (UCSD) using a working distance between 26 to 28 mm and voltage of 20 kV. Trace elements were collected from polished thin sections using a Thermo Fisher Scientific iCAP Qc Inductively Coupled Plasma Mass Spectrometry (ICP-MS) with New Wave Research UP213 Laser Ablation system at UCSD.
EBSD, electron backscatter diffraction, xenoliths, LA-ICP-MS, trace elements
EBSD, electron backscatter diffraction, xenoliths, LA-ICP-MS, trace elements
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