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We used Electron Backscattered Diffraction (EBSD) to characterize the microstructure in the transverse section of the shot-peened RR1000 Ni-based superalloy sample with a CamScan MX2000 equipped with an Oxford Instruments EBSD camera operating at an acceleration voltage of 20 kV and using a step size of 0.45 µm. The sample was ground to #4000 grit paper and finished with OP-S (0.2 µm) suspension for ~30 min. EBSD data was analysed using the commercial Channel 5 software (Oxford Instruments). This EBSD map is coupled with the HRDIC strain map in http://doi.org/10.5281/zenodo.4728016 and data visualisation scripts in http://doi.org/10.5281/zenodo.4727939
EBSD; HRDIC; Nickel superalloy; Shot peening; Strain localization
EBSD; HRDIC; Nickel superalloy; Shot peening; Strain localization
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