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Calibration data set measured at Beamline 4.0.2 of the Advanced Light Source (Berkeley, CA) using the resonant soft x-ray scattering endstation. Scan ID: 8044 Calibration standard with 200-nm X 200-nm pitch
x-ray, BL4.0.2, diffraction, ALS, RSXD, CCD
x-ray, BL4.0.2, diffraction, ALS, RSXD, CCD
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
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