Scanning electronic microscopy (SEM), Energy dispersive X-rays Spectroscopy (EDS) and image analysis have been used as techniques to analyse the results of etching experiments carried on NdFeB permanent magnets by using the ionic liquid Cyphos IL 101 saturated with HCl. Image analysis is for the first time reported in the literature as a technique for corrosion studies. Operational conditions of the analysis equipment were the following: - The samples were analyzed via electron microscopy and image analysis. Scanning electron microscope (SEM) pictures and energy dispersed spectra (EDS) were collected with a JEOL JSM 5800 microscope, operating at 20 kV. The polished samples were made conductive by spraying a carbon layer on them using a Balzer SCD 050 sputter coater. - The EDS analysis were collected as average on 5 points per each SEM picture - A commercial software, ImageJ®, was used for the image analysis. Two data were analysed: the Feret diameter, dF, and the percentage of etched area, %area. The SEM images were converted to 8-bit grayscale, from 0 to 255 number of grey ranges. Simple linear scaling was applied

{"references": ["T. Ferreira, W. Rasband, ImageJ User Guide User Guide ImageJ, Image J User Guid. 1.46r (2012). doi:10.1038/nmeth.2019."]}