HR-EBSD measurements made on a Zircaloy-2 sample deformed to 2.7% in tension to generate multiple deformation twins. HR-EBSD measurements were made using A Bruker HReFlash detector mounted on a Zeiss Merlin SEM. Sample preparation used Ar ion beam milling on a Gatan PECS II system as a final step. The strain, stress and dislocation density variations available here were then calculated using in-house Matlab code (XEBSD). The work and further analysis of the results is described in Assessment of residual stress fields at deformation twin tips and the surrounding environments, Abdolvand & Wilkinson, Acta Materialia (2016) dx.doi.org/10.1016/j.actamat.2015.11.036 The analysis methods implement in XEBSD are described in the following publications: High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations TB Britton and AJ Wilkinson Ultramicroscopy, (2012), vol. 114, 82-95 doi:10.1016/j.ultramic.2012.01.004 Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction TB Britton and AJ Wilkinson Ultramicroscopy, (2011) vol. 111, 1395-1404 doi:10.1016/j.ultramic.2011.05.007 Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction AJ Wilkinson and D Randman Philosophical Magazine, (2010), vol. 90, 1159-1177 doi:10.1080/14786430903304145 Crystal Plasticity Analysis of Micro-Deformation, Lattice Rotation and Geometrically Necessary Dislocation Density FPE Dunne, R Kiwanuka, AJ Wilkinson Proc. Royal Society A, (2012), vol. 468, 2509-2531 doi:10.1098/rspa.2012.0050