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v4.0 of the eNanoMapper Ontology (ENM) covers 10,881 classes, compared with 8407 classes in version 3. What's new in eNM V4.0: 162 New modelling-related terms selected by NTUA have been added to cover experimental and calculated (image analysis and algorithm-derived) descriptors. Around 200 new terms have been added as a result of input from the NanoSafety Cluster Community (NANoREG, Nano WG and NECID etc.). As a byproduct of the development of the eNanoMapper Ontology, interaction with upstream ontologies has led to the incorporation of several terms in other ontologies, particularly in the Bioassay Ontology (BAO), the Information Artifact Ontology (IAO) and the NanoParticle Ontology (NPO).
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