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Good Practices for image analysis software (CCP-volumeEM show and tell)

Authors: Meechan, Kimberly;

Good Practices for image analysis software (CCP-volumeEM show and tell)

Abstract

Every year, hundreds of new image analysis tools are created and released for analysis of microscopy data. Few of these will stand the test of time though - with many becoming unusable within a few years (or even months!) of publication. How can we make long-term maintenance and update of these tools easier? How can we ensure new updates don't break existing functionality? In this talk, I will focus on 'good software practices' that help make your software more robust e.g. automated testing, dependency updates and versioning. I will give examples from Fiji / napari plugins (as these are very popular for volume electron microscopy data), but the general principles should be applicable to any kind of image analysis software.

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