IODP Expedition 368X XRF Summary
Childress, L.B.; Alvarez Zarikian, C.A.; Briais, A.; Dadd, K.A.; Deng, J.-M.; Hoefig, T.W.; Huang, X.-L.; +14 Authors
Childress, L.B.; Alvarez Zarikian, C.A.; Briais, A.; Dadd, K.A.; Deng, J.-M.; Hoefig, T.W.; Huang, X.-L.; Li, B.; Lin, J.; Liu, C.; Liu, Z.; Nirrengarten, M.F.R.; Peate, D.W.; Qiu, N.; Satolli, S.; Stock, J.M.; Sun, Z.; van der Zwan, F.M.; Xiang, R.; Yi, L.; Zhong, L.;
IODP Expedition 368X XRF Summary
Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions.