IODP Expedition 368X X-ray diffraction (XRD)
Childress, L.B.; Alvarez Zarikian, C.A.; Briais, A.; Dadd, K.A.; Deng, J.-M.; Hoefig, T.W.; Huang, X.-L.; +14 Authors
Childress, L.B.; Alvarez Zarikian, C.A.; Briais, A.; Dadd, K.A.; Deng, J.-M.; Hoefig, T.W.; Huang, X.-L.; Li, B.; Lin, J.; Liu, C.; Liu, Z.; Nirrengarten, M.F.R.; Peate, D.W.; Qiu, N.; Satolli, S.; Stock, J.M.; Sun, Z.; van der Zwan, F.M.; Xiang, R.; Yi, L.; Zhong, L.;
IODP Expedition 368X X-ray diffraction (XRD)
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG).