IODP Expedition 361 Scanning electron microscope images
Hall, I.R.; Hemming, S.R.; LeVay, L.J.; Barker, S.; Berke, M.A.; Brentegani, L.; Caley, T.; +22 Authors
Hall, I.R.; Hemming, S.R.; LeVay, L.J.; Barker, S.; Berke, M.A.; Brentegani, L.; Caley, T.; Cartagena-Sierra, A.; Charles, C.D.; Coenen, J.J.; Crespin, J.G.; Franzese, A.M.; Gruetzner, J.; Han, X.; Hines, S.K.V.; Jimenez-Espejo, F.J.; Just, J.; Koutsodendris, A.; Kubota, K.; Lathika, N.; Norris, R.D.; Pereira dos Santos, T.; Robinson, R.; Rolinson, J.M.; Simon, M.H.; Tangunan, D.; van der Lubbe, J.J.L.; Yamane, M.; Zhang, H.;
IODP Expedition 361 Scanning electron microscope images
Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and captured as image files. These files were uploaded along with a brief description and a record of the microscopic conditions when the image was taken.