IODP Expedition 361 Color reflectance
Hall, I.R.; Hemming, S.R.; LeVay, L.J.; Barker, S.; Berke, M.A.; Brentegani, L.; Caley, T.; +22 Authors
Hall, I.R.; Hemming, S.R.; LeVay, L.J.; Barker, S.; Berke, M.A.; Brentegani, L.; Caley, T.; Cartagena-Sierra, A.; Charles, C.D.; Coenen, J.J.; Crespin, J.G.; Franzese, A.M.; Gruetzner, J.; Han, X.; Hines, S.K.V.; Jimenez-Espejo, F.J.; Just, J.; Koutsodendris, A.; Kubota, K.; Lathika, N.; Norris, R.D.; Pereira dos Santos, T.; Robinson, R.; Rolinson, J.M.; Simon, M.H.; Tangunan, D.; van der Lubbe, J.J.L.; Yamane, M.; Zhang, H.;
IODP Expedition 361 Color reflectance
Color reflectance data were measured on section halves using an integration sphere and a UV-VIS spectrophotometer mounted on the Section Half Multisensor Logger (SHMSL). Spectral counts are recorded in the range of 380 to 700 nm, covering the visible spectrum, and binned in ~2 nm bins. Spectral data are reduced from spectra and recorded in tristimulus XYZ values, CieLAB L*a*b* values, and other units.