Multimodal synchrotron-based techniques are emerging as powerful tools for advanced materials characterization, enabling simultaneous insights into both crystal and electronic structure. We present a combined X-ray diffraction (XRD) and high-resolution X-ray emission spectroscopy (XES) approach implemented in a double-dispersive setup. This configuration enables simultaneous acquisition of structural and spectroscopic information with high precision, allowing us to resolve correlations between lattice arrangements and electronic configurations under in situ conditions. To enhance experimental throughput and reproducibility, we employ digital twin concepts and optimization algorithms for experiment design and parameter control. These methods effectively eliminate trial-and-error procedures when optimizing the setup to achieve the desired resolution for XES analysis. In addition, we introduce SpecTwin, a dedicated software environment that integrates XES data analysis, simulation, and optimization routines. This combined methodology underscores the potential of algorithm-assisted multimodal X-ray experiments to advance the quantitative understanding of structure–property relationships in complex materials.