Powered by OpenAIRE graph
Found an issue? Give us feedback
image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ figsharearrow_drop_down
image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
figshare
Presentation . 2026
License: CC BY
Data sources: Datacite
image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
figshare
Presentation . 2026
License: CC BY
Data sources: Datacite
Open Science Framework
Other literature type . 2026
Data sources: Datacite
ResearchGate Data
Presentation . 2026
Data sources: Datacite
ZENODO
Presentation . 2026
License: CC BY
Data sources: Datacite
ZENODO
Presentation . 2026
License: CC BY
Data sources: Datacite
versions View all 6 versions
addClaim

Carrier lifetime measurements

Authors: Chernyavskiy, Evgeny;

Carrier lifetime measurements

Abstract

The minority carrier lifetime is a crucial parameter in semiconductor materials, especially for integrated circuits (ICs), due to its significant impact on device performance, speed, and reliability. Here's why it matters: Carrier Dynamics: Minority carrier lifetime refers to the average time a minority charge carrier (electron in a p-type material or hole in an n-type material) exists before recombining. This is vital in defining the overall behavior of semiconductor devices. Switching Speed: In ICs, transistors, diodes, and other components rely on the movement of charge carriers. A long minority carrier lifetime can slow down the recombination process, reducing the switching speed of the bipolar transistor, thus impacting the BiCMOS IC's performance. Charge Storage: Longer minority carrier lifetimes can lead to excessive charge accumulation, especially in devices like photodiodes or solar cells. This might cause delay in switching or signal processing, reducing the overall efficiency. Signal Integrity: For high-speed digital circuits, fast carrier recombination is necessary to maintain signal integrity. A long minority carrier lifetime could result in charge retention, causing distortion or cross-talk between circuit components. Leakage Currents: A short minority carrier lifetime can also increase leakage currents in MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors), leading to higher static power consumption and reduced efficiency. Process Control: Semiconductor manufacturing processes aim to control the minority carrier lifetime to optimize device performance. If it's too long, charge carriers may not dissipate quickly enough; if too short, devices may fail to properly conduct or switch. Device Scaling: As ICs scale down to smaller nodes, controlling minority carrier lifetime becomes more critical to prevent unwanted effects like slow turn-on and turn-off characteristics in transistors. Subthreshold Swing: The minority carrier lifetime affects the subthreshold swing of a transistor, which is the rate at which the current changes as a function of gate voltage. This impacts how quickly the device can switch off, which is crucial for power efficiency. Noise Performance: A long minority carrier lifetime can also increase the thermal noise in semiconductor devices, affecting the signal-to-noise ratio (SNR) and leading to degraded performance, especially in analog circuits. Reliability Concerns: Over time, excessive minority carrier lifetime can contribute to device degradation, such as the development of hot carriers or latch-up phenomena, reducing the overall reliability of the IC. In summary, managing minority carrier lifetime is key to ensuring fast, efficient, and reliable operation of integrated circuits. It impacts switching speed, leakage currents, power.

  • BIP!
    Impact byBIP!
    selected citations
    These citations are derived from selected sources.
    This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
    0
    popularity
    This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
    Average
    influence
    This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
    Average
    impulse
    This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
    Average
Powered by OpenAIRE graph
Found an issue? Give us feedback
selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average