On-Wafer Metrology for High-Frequency Circuits
Phung, Gia Ngoc;
On-Wafer Metrology for High-Frequency Circuits
To date, it has not been possible to compare on-wafer measurements because the measuring equipment and laboratory conditions significantly differ from each other and there have not been any reference substrates. The first international measurement comparison has now taken place. PTB has confirmed its high-frequency calibration capabilities on reference substrates and has developed the world’s first complete measurement uncertainty budget of up to 330 GHz.
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selected citations
Citations provided by BIP!
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
Citations provided by BIP!popularityPopularity provided by BIP!
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
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