
This dataset contains: Simulated results of leakage current through thin Al2O3 layers obtained by calibrated TCAD simulations Information about simulator and model used Calibrated model parameters This calibrated model has been presented and used in the publication: 10.1109/ACCESS.2025.3561255
TCAD simulations, Leakage current, Aluminum Oxide
TCAD simulations, Leakage current, Aluminum Oxide
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
