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Serial three-dimensional electron diffraction raw datasets

Research datakeyboard_double_arrow_right Dataset 28 Jul 2025Publisher:Zenodo

Authors: Hu, Junyi; Dong, Zhuoya; Chu, Chaoyang; Ma, Yanhang;

doi: 10.5281/zenodo.16533377 , 10.5281/zenodo.16533375

Serial three-dimensional electron diffraction raw datasets

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Abstract

Raw serial three-dimensional electron diffraction (3D ED) datasets acquired from enantiomerically mixed crystalline powders of tellurium. All experiments were performed on a JEOL F200 transmission electron microscope operating at 200 kV, equipped with a hybrid pixel detector (Amsterdam Scientific Instruments) for both imaging and diffraction data collection.

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