In this work, we explored data acquisition protocols and improved data reduction protocols using PDFgetX3 to obtain reliable data for atomic pair distribution function (PDF) analysis from a laboratory-based Mo x-ray source. A variable counting scheme is described that preferentially counts in the high-angle region of the diffraction pattern. The effects on the resulting PDF are studied by varying the overall count time, the use of Soller slits, and limiting the out-of-plane divergence of the incident beam. The protocols are tested using an amorphous silica and a quartz sample. We also present a modification to the current PDFgetX3 data corrections to take care of sample absorption, which was previously neglected in the use of that program for high-energy synchrotron x-ray data. We show that, despite limitations in the Q-range and flux of laboratory instruments, reasonable data for PDF model fits may be obtained using the best protocols in a few hours of counting.