
The two uploaded datasets are published in the following article: Minenkov, Hollweger, Duchoslav, Erdene-Ochir, Weise, Ermilova, Hertwig, Schiek.Monitoring the Electrochemical Failure of Indium Tin Oxide Electrodes via Operando Ellipsometry Complemented by Electron Microscopy and Spectroscopy.ACS Appl. Mater Interfaces 16 (2024) 9517. https://doi.org/10.1021/acsami.3c17923 Dataset "NK ITO layer XY5S.txt" contains the complex refractive index of an ITO layer on glass type XY15S purchased from Xinyan Technology LTD. Dataset "NK graded ITO layer.txt" contains the complex refractive index of a sputtercoated, graded ITO layer on a SiO2-Si-wafer.
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
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| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
