
Description Dataset for synchrotron-based x-ray photoelectron (XPS) spectra of Li doped MoS2 nanofilms grown on c-plane sapphire substrate by two techniques: thermally assisted conversion (TAC) and pulsed laser deposition (PLD). Reference spectra for undoped MoS2 were measured on a commercial MoS2 powder sample. Data formats The XPS datasets are available in two formats. VAMAS (ASCII ISO 14976). Plain text column files: Double-column files (dat) and corresponding metadata files (txt).
Sample preparation MoS2 nanofilms were synthesized using two techniques: Thermally assisted conversion (TAC) of 1-nm-thick Mo by one-zone sulfurization. Pulsed laser deposition (PLD). Lithium was incorporated into the as-prepared MoS2 films by solid-state diffusion during the subsequent sulfurization process, where a part of sulfur powder was replaced by lithium sulfide (Li2S) as a source of Li.
Data were acquired at BACH beamline, Elettra synchrotron facility. Access was provided by IOM-CNR in Trieste (Italy) within the framework of the NFFA-Europe Pilot Transnational Access Activity, proposal ID101.
photoemission spectroscopy, thin films, lithium, synchrotron radiation, photoelectron spectroscopy, XPS, TAC, molybdenum disulfide, PLD, MoS2
photoemission spectroscopy, thin films, lithium, synchrotron radiation, photoelectron spectroscopy, XPS, TAC, molybdenum disulfide, PLD, MoS2
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