This is the complimentary dataset for "A low-cost electron backscatter diffraction system based on a Timepix3 direct electron detector". Contents: - Single Si(100) diffraction patterns at 4 camera lengths, and at 4 corners of the sample - Horizontal and vertical line scan on Si(100) with 20 grid points - 20x20 mapping scan on a polycrystalline Cu sample Scan parameters for the line scans and map are included in logfiles within each subfolder. All pattern files are provided in .h5 format and .tif format. Analyses of the patterns were performed with AstroEBSD and MTEX.