Accurate evaluation of a millimeter wave compact range using planar near-field scanning

descriptionPublicationkeyboard_double_arrow_right Article 01 May 1982 English Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Antennas and Propagation, volume 30, pages 419-425 (issn: 0096-1973,

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Authors: Repjar, A.; Kremer, D.;

doi: 10.1109/tap.1982.1142800

Accurate evaluation of a millimeter wave compact range using planar near-field scanning

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Abstract

Significant progress has been made in recent years on planar near-field measurements for antenna calibrations. Such measurements are also useful in the alignment and evalnation of compact ranges because they provide more information than a limited number of analogue plots in one dimension. Contour plots of amplitude and phase data obtained from more complete two-dimensional measurements precisely and accurately locate sources of problems in the range reflector, with phase contour plots being more useful as diagnostic tools.

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