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https://doi.org/10.1109/ispsd....
Article . 2011 . Peer-reviewed
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Reliability study of Au-In transient liquid phase bonding for SiC power semiconductor packaging

Authors: Grummel, Brian; Mustain, Habib A.; Shen, Z. John; Hefner, Allen R.;

Reliability study of Au-In transient liquid phase bonding for SiC power semiconductor packaging

Abstract

Transient liquid phase (TLP) bonding is a promising advanced die-attach technique for wide-bandgap power semiconductor and high-temperature packaging. TLP bonding advances modern soldering techniques by raising the melting point to over 500 °C without detrimental high-lead materials. The bond also has greater reliability and rigidity due in part to a bonding temperature of 200 °C that drastically lowers the peak bond stresses. Furthermore, the thermal conductivity is fractionally increased 67 % while the bond thickness is substantially reduced, lowering the thermal resistance by an order of magnitude or more. It is observed that Au-In TLP bonds exude excellent electrical reliability against thermal cycling degradation if designed properly as experimentally confirmed in this work.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
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