Instrument driver design

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 20 Jan 2003Publisher:IEEEJournal:1999 IEEE AUTOTESTCON Proceedings (Cat. No.99CH36323)

Authors: Lan Vuu,; Khan, A.;

doi: 10.1109/autest.1999.800368

Instrument driver design

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Abstract

Many organizations in Automatic Test Equipment (ATE) are involved in upgrading aging test stations or development of new test stations to state-of-the-art VXI plug&play technology. The instrument drivers for the F-16 Analog Test Station Sustainment (FATSS) were developed using the LABWindows/CVI environment with Object-Oriented (OO) programming design. The objective of this paper is to illustrate the driver development using this OO architecture.

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