A switching lattice is a two-dimensional array of four-terminal switches implemented in its cells. Each switch is linked to the four neighbors and is connected with them when the switch is ON, or is disconnected when the switch is OFF. Recently, with the advent of a variety of emerging nanoscale technologies based on regular arrays of switches, lattices of multi-terminal switches, originally introduced by Akers in 1972, have found a renewed interest. In this paper, the testability under the Cellular Fault Model (CFM) of switching lattices is defined and analyzed. Moreover, some techniques for improving the testability of lattices are discussed and experimentally evaluated.