Examines a number of possible geometrical effects that may show up in either upset measurements or upset calculations. The geometrical effets are with respect to a number of unusual experimental measurements, and an attempt is made to fit these results into a common set of concepts. In most cases, the results will not be decisive and there will still be room for alternative analysis. In some of these cases, it may be necessary to perform detailed charge collection or microbeam experiments in order to reach closure. However, the authors believe that the concepts and questions that they introduce are fundamental for a complete understanding of single event upsets in modern devices. In particular, they continue to maintain that the basic upset cross section curve can be represented by a single smooth curve. They summarize the knowledge of the funnel effect and indicate approaches for including the funnel in upset rate predictions. >