Critical current density is a fundamental property of superconductors, but its measurement is challenging due to the complex interplay of various factors. This article discusses the differences between measured and theoretical critical current densities, highlighting the importance of considering the material's microstructure, defects, and other extrinsic factors. The authors propose a new approach to measuring critical current density, which takes into account the material's intrinsic properties and the effects of defects and microstructure. This approach is expected to provide a more accurate representation of the material's critical current density, which is essential for the development of high-performance superconducting devices. The article also discusses the implications of this new approach for the design and optimization of superconducting materials and devices. Keywords: superconductors, critical current density, measurement, microstructure, defects, intrinsic properties, extrinsic factors, high-performance devices. }