
С помощью предложенного авторами ранее интерферометрического метода определены временные зависимости радиусов кривизны лежащих капель в их вершине в условиях открытого испарения. Рассмотрено влияние подложки на поведение регистрируемых параметров. Показано, что оно различно для гладкой и грубой подложек, различающихся способностью удерживать линию контакта трех фаз неподвижной. The time dependences of the radius of curvature in the vertice of the sessile drops are determined in conditions of the free evaporation with the aid of the earlier suggested interferometric method. The substrate's influence on the behavior of the registered parameters is studied. It is shown, that this influence differs in the cases of even and coarse substrate specified by the ability to hold the three phase contact line in place. Pyzin Georgii Petrovich - Cand. Sci. (Technical Sci.), Associate Professor, General and Theoretical Physics Department, South Ural State University. Пызин Георгий Петрович - кандидат технических наук, доцент, кафедра общей и теоретической физики, Южно-Уральский государственный университет. e-mail: hologrph@mail.ru Ushakov Vladimir Leonidovich - Assistant Professor, General and Theoretical Physics Department, South Ural State University. Ушаков Владимир Леонидович - ассистент, кафедра общей и теоретической физики, Южно-Уральский государственный университет. Rechkalov Viktor Grigorevich - Cand. Sci. (Education Sci.), Associate Professor, General and Theoretical Physics Department, South Ural State University. Речкалов Виктор Григорьевич - кандидат педагогических наук, доцент, кафедра общей и теоретической физики, Южно-Уральский государственный университет.
капиллярные свойства, drop shape parameters, capillarity, радиус кривизны, radius of curvature, interferometry, форма капли, УДК 532.6
капиллярные свойства, drop shape parameters, capillarity, радиус кривизны, radius of curvature, interferometry, форма капли, УДК 532.6
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