Raw VSM data used to generate the figures of the paper entitled "Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic", as well as the figures in the supplementary material file. The data is presented in 2 columns, column 1 is the applied field in Oe, column 2 is the magnetization (reduced units). For Figure S1, the third column is the derivative of col 2 with respect to the applied field (col 1).

This work was supported by the ERC [grant number 247368: 3SPIN], EPSRC [grant number Early Career Fellowship EP/M008517/1], Marie Curie Cofund Action and the Netherlands Organization for Scientific Research: NWO-Rubicon 680-50-1024 and NWO-VENI 680-47-428, Marie Curie IEF within the 7th European Community Framework Programme No. 251698: 3DMAGNANOW and Winton Fundation

This research data supports “Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic” which has been published in “Nanotechnology”.