
doi: 10.1007/bf00568156
The formation of AgIn2 andAg2In compounds at Ag-In interface in Ag/In electrodeposited samples was studied by TDPAC in an isothermal annealing experiment in annealing temperatures 300–423 K. For 300 K the AgIn2 average thickness growth was found to follow a square root of time dependence but for higher temperatures a saturation like effect was observed. At annealing temperature 423 K the Ag2In formation took place anda linear growth of its average thickness versus t1/2 was found.
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