
Siphon-based deadlock control of Flexible Manufacturing System (FMS) runs faster by avoiding reachability analysis, but reaches fewer states than an optimal. First-met bad marking (FBM) method requires more monitors, but reaches more states by refining some monitors with smaller (hence less disturbed) controller regions. However, the same refinement leads to more monitors for other siphons, which can be combined without losing states. This paper develops the formal theory to uncover the secret behind the above discrepancy. It improves the siphon-based approach to reach more states while using fewer monitors.
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 54 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Top 10% | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Top 10% | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Top 10% |
