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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Transactions on...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
IEEE Transactions on Components Packaging and Manufacturing Technology Part A
Article . 1994 . Peer-reviewed
License: IEEE Copyright
Data sources: Crossref
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Epoxy encapsulation on ceramic quad flat packs (CQFPs)

Authors: J. Clementi; T. Carden; S. Engle;

Epoxy encapsulation on ceramic quad flat packs (CQFPs)

Abstract

The ceramic quad fat pack (CQFP) is a high-performance, low-cost technology for surface mount applications. It is an extension of the metallized ceramic (MC) and metallized ceramic with polyimide (MCP) product base. These finished modules conform to JEDEC I/O and footprint standards. The packages are available in 0.5 mm and 0.4 mm lead pitches with flexibility to address unique application requirements such as body sizes or lead counts/pitches. Semiconductor die interconnection is performed using either flip chip (controlled collapse chip connection-C4) attach or wirebonding. Excellent package reliability with no intrinsic wear-out failure mechanism results by encapsulating solder joints from the silicon C4 die and peripheral lead to ceramic carrier. IBM evaluated several encapsulant configurations, and tested over 2000 encapsulated carriers and 897000 individual solder joints during development and qualification. Reliability data was collected for a variety of stress tests and conditions. Both solder connections show a dramatic order of magnitude fatigue life improvement when encapsulation is used. Encapsulant selection has been made based on mechanical, electrical, and thermal requirements to meet package performance and reliability objectives. The sensitivity of material properties to process variables such as encapsulant dispense, gel, and cure has been characterized. As a result, material processing limits and conditions have been optimized for manufacturing high production volumes. >

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
3
Average
Average
Average
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