
handle: 2268/315397
High pressure dispersive EXAFS, Diffraction sous pression, EXAFS dispersif sous pression, Distorsion, Semi-conducteurs sous pression, Brisure de symétrie, Distortion, Materials science & engineering, Halogènes sous pression, Synchrotron, Engineering, computing & technology, Ingénierie, informatique & technologie, Science des matériaux & ingénierie, Symmetry, symétrie, High pressure diffraction, Clathrates sous pression, Pressure, Pression, Halogens under pressure, Symmetry-breaking, Semiconductors under pressure, Clathrates under pressure
High pressure dispersive EXAFS, Diffraction sous pression, EXAFS dispersif sous pression, Distorsion, Semi-conducteurs sous pression, Brisure de symétrie, Distortion, Materials science & engineering, Halogènes sous pression, Synchrotron, Engineering, computing & technology, Ingénierie, informatique & technologie, Science des matériaux & ingénierie, Symmetry, symétrie, High pressure diffraction, Clathrates sous pression, Pressure, Pression, Halogens under pressure, Symmetry-breaking, Semiconductors under pressure, Clathrates under pressure
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
