We report a novel perpendicularly magnetized thin film [Co91.5 Ta 4.5Zr4/Pd]5 multilayer, which exhibits strong perpendicular magnetic anisotropy when grown on 5 nm of Pd and Ru seed layers. The Pd-seeded multilayer annealed at 300 °C shows an effective uniaxial anisotropy constant, K eff = 1.1 MJ m−3, with an anisotropy field as high as 1.6 T. The perpendicular anisotropy is sustained on annealing at 400 °C for 1 h. X-ray diffraction on multilayers with 30 repeats suggests that the use of amorphous CoTaZr reduces the stress of the stack, compared to [Co/Pd] multilayer.

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