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Recolector de Ciencia Abierta, RECOLECTA
Bachelor thesis . 2022
License: CC BY NC ND
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Recolector de Ciencia Abierta, RECOLECTA
Bachelor thesis . 2022
License: CC BY NC ND
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Test platform for analog integrated circuits

Authors: Pulido Quintana, Javier Ignacio;

Test platform for analog integrated circuits

Abstract

El presente informe explica la metodología utilizada para el desarrollo de una plataforma de pruebas para circuitos integrados. Incluye cuatro fuentes de tensión programables con una tensión de salida máxima de 4.095 V, y cuatro fuentes de corriente programables (desarrolladas con fuentes de corriente Howland) con un máximo de 4.095 μA. La fuente de corriente incluye un límite de tensión de salida programable. La plataforma también incluye una opción de comunicación serial de 16 bits para interactuar con componentes digitales. Se puede acceder a las funcionalidades de la plataforma a través de una interfaz gráfica de usuario, y es necesario conectar la placa a una Raspberry Pi. Todas las fuentes de tensión y de corriente fueron sometidas a pruebas de fiabilidad y precisión, y los resultados muestran un funcionamiento fiable (dentro de ciertos límites para la fuente de corriente). Las fuentes de tensión presentaron un error máximo de ±10 mV, considerado aceptable dadas las especificaciones del fabricante de los componentes utilizados. La fuente de corriente presentó un error máximo de 30 nA, considerado un poco elevado. Se recomienda realizar más pruebas con todas las fuentes, especialmente con las de corriente. Las limitaciones a la evaluación del producto fueron impuestas por la disponibilidad de los equipos.

Aquest informe explica la metodologia utilitzada per al desenvolupament d'una plataforma de proves per a circuits integrats. Inclou quatre fonts de tensió programables amb una tensió de sortida màxima de 4.095 V, i quatre fonts de corrent programables (desenvolupades amb fonts de corrent Howland) amb un màxim de 4.095 μA. La font de corrent inclou un límit de tensió de sortida programable. La plataforma també inclou una opció de comunicació serial de 16 bits per interactuar amb components digitals. Es pot accedir a les funcionalitats de la plataforma mitjançant una interfície gràfica d'usuari, i cal connectar la placa a una Raspberry Pi. Totes les fonts de tensió i de corrent van ser sotmeses a proves de fiabilitat i precisió, i els resultats mostren un funcionament fiable (dins certs límits per a la font de corrent). Les fonts de tensió van presentar un error màxim de ±10 mV, considerat acceptable ateses les especificacions del fabricant dels components utilitzats. La font de corrent va presentar un error màxim de 30 nA, considerat una mica elevat. Es recomana fer més proves amb totes les fonts, especialment amb les de corrent. Les limitacions a l'avaluació del producte es van imposar per la disponibilitat dels equips.

The present report explains the methodology used for the development of a test platform for integrated circuits. It includes four programmable voltage sources with a maximum output voltage of 4.095 V, and four programmable current sources (developed using Howland current sources) with a maximum of 4.095 μA. The current source includes a programmable voltage compliance. The platform also includes a 16-bit serial communication option to interact with digital components. The platform capabilities can be accessed through a Graphical User Interface, and the board needs to be connected to a Raspberry Pi. All voltage and current sources were tested for reliability and accuracy, and the results show reliable functioning (within certain limits for the current source). The voltage sources presented a maximum error of ±10 mV, considered acceptable given the manufacturer specifications of the used components. The current source showed a maximum error of 30 nA, considered a bit high. Further testing is recommended for all the sources, especially the current sources. Limitations to the evaluation of the product were imposed by the availability of equipment.

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Keywords

Voltage Source, Voltage Compliance, Programmable Source, Current Reference, Current Source, Integrated Circuit Testing, Voltage Reference, :Enginyeria electrònica [Àrees temàtiques de la UPC], Integrated circuits, Circuits integrats, Voltage Reference., Àrees temàtiques de la UPC::Enginyeria electrònica

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selected citations
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This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
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influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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impulse
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