This research examines different methods of sample preparation, for microstructural characterization of graphite particles. To this purpose, the graphite particles contained in Compacted Graphite Iron are analyzed by Electron Backscattered Diffraction technique. Knowing the crystal orientation of graphite particles is important to understand how its growth occurs. Until now, many theories have been presented without becoming one predominant over the others (Stefanescu, Alonso, Larrañaga, De la Fuente, & Suarez, 2016). Furthermore, by knowing the orientation of the crystals, the interaction at the interface particle-matrix can be understood more clearly. This will help to better comprehend the properties of the material, thereby improving the design and manufacturing processes for pieces. Four methods have been tested: Traditional sample preparation, Focus Ion Beam (FIB) lithography, ion milling parameters simulation with FIB and brittle fracture. The first two have not yielded any result; while the results obtained in the other two are inconclusive due to lack of repeatability and that they are found in very few particles. Therefore, the study of Broad Ion Beam, which is certainly the most promising of all methods set, remains for future research.