
The spectral and non-spectral inteferences of tantalum to the determination of Al, Ca, Cr, Cu, Fe, Mg, Mn, Mo, Nb, Ni, Pb, Sn and Ti by ICP-AES were studied. The non-spectral inteference can be eliminated by optimizing operating conditions. Three methods for correction of spectral inteferences were evaluated. The proposed method was used for the determination of impurities in synthetic samples with satisfactory results.
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