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Conference object . 2023
Full-Text: https://iris.inrim.it/bitstream/11696/77599/1/Abstract_MSMM_23_Cultre_ERT_reference_data.pdf
Data sources: METRology Institutional CAtalog
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Reference data for Electrical Resistance Tomography

descriptionPublicationkeyboard_double_arrow_right Conference object 01 Jan 2023 Italy English
Authors: alessandro cultrera; Gabriele Germito; Luca Callegaro;

handle: 11696/77599

Reference data for Electrical Resistance Tomography

Abstract

At the conference we will present a first draft of a machine-readable refer- ence dataset structure for ERT measurements on thin film materials, based on XLM language. Reference data will include ERT measurements, along with a set of meta- data, such as information about the samples (geometry, materials), the measurement protocol used to perform the ERT multiterminal measurements, the measurements uncertainty, instrumentation specifications.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
Green