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Recolector de Ciencia Abierta, RECOLECTA
Bachelor thesis . 2015
License: CC BY NC ND
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Entorno de simulación Hardware-In-the-Loop para estudios de tolerancia a fallos en sistemas electrónicos complejos

Authors: López Gómez, Daniel;

Entorno de simulación Hardware-In-the-Loop para estudios de tolerancia a fallos en sistemas electrónicos complejos

Abstract

Lo que el lector se encontrará en este documento es la descripción de un nuevo método de análisis de la tolerancia a fallos en sistemas electrónicos, dándole un enfoque diferente al que ya se le ha dado en los estudios existentes . Detallando lo que se encontrará en cada capítulo: A lo largo de los dos primeros capítulos se hará un estudio del estado del arte en el ámbito de la inyección de fallos y un breve resumen de lo que ha caracterizado hasta ahora a estos estudios . Los capítulos 3 y 4 contienen la descripción de la técnica que se quiere mostrar , de modo que se especificarán tanto sus características como los pasos y las herramientas necesarias para su realización. En el capítulo 5 se encuentran los resultados obtenidos a partir de los varios análisis que se han llevado a cabo durante la realización de este trabajo, además de también analizarlos y arrojar conclusiones sobre ellos . Por último, los capítulos 6 y 7 recogen la interpretación personal del autor acerca de si se han alcanzado los objetivos propuestos inicialmente y los posibles trabajos que podrían realizarse en el futuro como continuación del aquí realizado

What the reader will find in this document is the description of a new method of analysis of fault tolerance in electronic systems, giving it a different approach than has already been given in existing studies. Detailing what can be found in each chapter: In the first two chapters, the state of the art in the field of fault injection will be detailed and also a brief summary of the characteristics of the studies existing . Chapters 3 and 4 contain the description of the technique to be shown, so that their characteristics, and the steps and tools necessary for implementation will be specified. In Chapter 5 the results obtained from the various analyses that have been carried out during the course of this work are described. Additionally, results are analyzed in order to draw conclusions from them . Finally, chapters 6 and 7 collect the personal interpretation of the author on whether the goals initially planned have been achieved and the possible work that could be done in the future as a continuation of what has been done here

Grado en Ingeniería de las Tecnologías de Telecomunicación

Country
Spain
Related Organizations
Keywords

circuitos electrónicos, Tolerancia a fallos (Informática)

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
Green